Introduction
The National Testing Agency (NTA) has released the JEE Main 2025 admit cards for the January 28-30 exams. This is a crucial step for students aspiring to secure admissions to engineering, technology, and architecture programs in India.
Eligibility Criteria
To be eligible for the JEE Main 2025 exam, candidates must have successfully registered for the examination. The exam is open to students who have completed their 10+2 or equivalent examination.
Exam Schedule
The JEE Main 2025 exam will be conducted in two shifts on January 28, 29, and 30, 2025. The first shift will be from 9:00 AM to 12:00 PM, and the second shift from 3:00 PM to 6:00 PM4. The exam will be held at various centres across the country.
Admit Card Details
Candidates can download their admit cards from the official NTA website. To download the admit card, candidates need to enter their application number and date of birth. It is essential to check the details printed on the admit card, such as name, photo, signature, and QR code, to ensure accuracy.
Application Process
To apply for the JEE Main 2025 exam, candidates must follow these steps:
- Visit the Official NTA Website: Go to jeemain.nta.nic.in.
- Register for the Exam: Fill out the online application form and submit it.
- Upload Required Documents: Upload scanned copies of your passport-sized photograph and signature.
- Pay the Application Fee: Complete the payment process through online modes.
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Download the Admit Card: Once the admit card is released, download it and take a printout.
Important Guidelines
On the exam day, candidates must bring their admit card along with a valid photo ID. Entry to the exam hall will be denied without these documents. Candidates should arrive at the exam centre well in advance to avoid any last-minute issues.
Conclusion
The release of the JEE Main 2025 admit cards marks a significant milestone for aspiring engineers. By following the guidelines and preparing diligently, candidates can maximize their chances of success in this highly competitive exam.
